Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing

Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu. Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]

Authors

Tasuku Fujibe

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Masakatsu Suda

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Kazuhiro Yamamoto

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Yoshihito Nagata

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Kazuhiro Fujita

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Daisuke Watanabe

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Toshiyuki Okayasu

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