Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu. Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
@inproceedings{FujibeSYNFWO09,
title = {Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing},
author = {Tasuku Fujibe and Masakatsu Suda and Kazuhiro Yamamoto and Yoshihito Nagata and Kazuhiro Fujita and Daisuke Watanabe and Toshiyuki Okayasu},
year = {2009},
doi = {10.1109/TEST.2009.5355735},
url = {http://dx.doi.org/10.1109/TEST.2009.5355735},
researchr = {https://researchr.org/publication/FujibeSYNFWO09},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}