Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh-Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Shivam Bhasin, Jean-Luc Danger. Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage. IEICE Transactions, 97-C(4):272-279, 2014. [doi]
@article{FujimotoMNHHAHKSLBBBD14,
title = {Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage},
author = {Daisuke Fujimoto and Noriyuki Miura and Makoto Nagata and Yu-ichi Hayashi and Naofumi Homma and Takafumi Aoki and Yohei Hori and Toshihiro Katashita and Kazuo Sakiyama and Thanh-Ha Le and Julien Bringer and Pirouz Bazargan-Sabet and Shivam Bhasin and Jean-Luc Danger},
year = {2014},
url = {http://search.ieice.org/bin/summary.php?id=e97-c_4_272},
researchr = {https://researchr.org/publication/FujimotoMNHHAHKSLBBBD14},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {97-C},
number = {4},
pages = {272-279},
}