Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique

Hideo Fujiwara, Osamu Fujisawa, Kazunori Hikone. Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 642-648, IEEE Computer Society, 1988.

Authors

Hideo Fujiwara

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Osamu Fujisawa

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Kazunori Hikone

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