Hideo Fujiwara, Osamu Fujisawa, Kazunori Hikone. Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 642-648, IEEE Computer Society, 1988.
@inproceedings{FujiwaraFH88,
title = {Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique},
author = {Hideo Fujiwara and Osamu Fujisawa and Kazunori Hikone},
year = {1988},
tags = {logic programming, logic, coverage},
researchr = {https://researchr.org/publication/FujiwaraFH88},
cites = {0},
citedby = {0},
pages = {642-648},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}