A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test

Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue. A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 85-90, IEEE, 2013. [doi]

Authors

Yuki Fukazawa

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Tsuyoshi Iwagaki

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Hideyuki Ichihara

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Tomoo Inoue

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