A built-in power supply noise probe for digital LSIs

Mitsuya Fukazawa, Koichiro Noguchi, Makoto Nagata, Kazuo Taki. A built-in power supply noise probe for digital LSIs. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 106-107, IEEE, 2006. [doi]

@inproceedings{FukazawaNNT06,
  title = {A built-in power supply noise probe for digital LSIs},
  author = {Mitsuya Fukazawa and Koichiro Noguchi and Makoto Nagata and Kazuo Taki},
  year = {2006},
  doi = {10.1145/1118299.1118329},
  url = {http://doi.acm.org/10.1145/1118299.1118329},
  researchr = {https://researchr.org/publication/FukazawaNNT06},
  cites = {0},
  citedby = {0},
  pages = {106-107},
  booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006},
  editor = {Fumiyasu Hirose},
  publisher = {IEEE},
  isbn = {0-7803-9451-8},
}