A built-in power supply noise probe for digital LSIs

Mitsuya Fukazawa, Koichiro Noguchi, Makoto Nagata, Kazuo Taki. A built-in power supply noise probe for digital LSIs. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 106-107, IEEE, 2006. [doi]

Abstract

Abstract is missing.