Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing - researchr publication authors

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Munetoshi Fukui, Yasuhiko Nara, Junichi Fuse. Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 4, IEEE Computer Society, 2012. [doi]

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