Munetoshi Fukui, Yasuhiko Nara, Junichi Fuse. Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 4, IEEE Computer Society, 2012. [doi]
@inproceedings{FukuiNF12,
title = {Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing},
author = {Munetoshi Fukui and Yasuhiko Nara and Junichi Fuse},
year = {2012},
doi = {10.1109/ATS.2012.80},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.80},
researchr = {https://researchr.org/publication/FukuiNF12},
cites = {0},
citedby = {0},
pages = {4},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}