An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD

Shuhei Fukunaga, Tsuyoshi Funaki, Shinsuke Harada, Yusuke Kobayashi. An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD. IEICE Electronic Express, 16(17):20190392, 2019. [doi]

Abstract

Abstract is missing.