Franco Fummi, Donatella Sciuto, Micaela Serra. A Functional Approach to Delay Faults Test Generation for Sequential Circuits. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 51-57, IEEE Computer Society, 1994.
Abstract is missing.