Shigehiro Funatsu, Masato Kawai, Akihiko Yamada. Scan design at NEC. IEEE Design & Test of Computers, 6(3):50-51, 1989. [doi]
@article{FunatsuKY89,
title = {Scan design at NEC},
author = {Shigehiro Funatsu and Masato Kawai and Akihiko Yamada},
year = {1989},
doi = {10.1109/54.32412},
url = {https://doi.org/10.1109/54.32412},
researchr = {https://researchr.org/publication/FunatsuKY89},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {6},
number = {3},
pages = {50-51},
}