Electromagnetic Fault Injection as a New Forensic Approach for SoCs

Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre. Electromagnetic Fault Injection as a New Forensic Approach for SoCs. In 12th IEEE International Workshop on Information Forensics and Security, WIFS 2020, New York City, NY, USA, December 6-11, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Clément Gaine

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Driss Aboulkassimi

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Simon Pontié

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Jean-Pierre Nikolovski

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Jean-Max Dutertre

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