Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre. Electromagnetic Fault Injection as a New Forensic Approach for SoCs. In 12th IEEE International Workshop on Information Forensics and Security, WIFS 2020, New York City, NY, USA, December 6-11, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{GaineAPND20,
title = {Electromagnetic Fault Injection as a New Forensic Approach for SoCs},
author = {Clément Gaine and Driss Aboulkassimi and Simon Pontié and Jean-Pierre Nikolovski and Jean-Max Dutertre},
year = {2020},
doi = {10.1109/WIFS49906.2020.9360902},
url = {https://doi.org/10.1109/WIFS49906.2020.9360902},
researchr = {https://researchr.org/publication/GaineAPND20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th IEEE International Workshop on Information Forensics and Security, WIFS 2020, New York City, NY, USA, December 6-11, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9930-6},
}