Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre. Electromagnetic Fault Injection as a New Forensic Approach for SoCs. In 12th IEEE International Workshop on Information Forensics and Security, WIFS 2020, New York City, NY, USA, December 6-11, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.