A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification - researchr publication authors

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Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz. A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-2, IEEE, 2020. [doi]

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