Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz. A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-2, IEEE, 2020. [doi]
@inproceedings{GaitaNDBBP20,
title = {A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification},
author = {Andrei Gaita and Georgian Nicolae and Emilian C. David and Andi Buzo and Corneliu Burileanu and Georg Pelz},
year = {2020},
doi = {10.1109/ETS48528.2020.9131599},
url = {https://doi.org/10.1109/ETS48528.2020.9131599},
researchr = {https://researchr.org/publication/GaitaNDBBP20},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}