Dinesh D. Gaitonde, Jitendra Khare, D. M. H. Walker, Wojciech P. Maly. Estimation of reject ratio in testing of combinatorial circuits. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 319-325, IEEE, 1993. [doi]
Abstract is missing.