Built-in self test for C-testable ILA s

Murali M. R. Gala, Don E. Ross, Karan L. Watson, Beena Vasudevan, Peter Utama. Built-in self test for C-testable ILA s. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(11):1388-1398, 1995. [doi]

Authors

Murali M. R. Gala

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Don E. Ross

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Karan L. Watson

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Beena Vasudevan

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Peter Utama

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