Murali M. R. Gala, Don E. Ross, Karan L. Watson, Beena Vasudevan, Peter Utama. Built-in self test for C-testable ILA s. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(11):1388-1398, 1995. [doi]
@article{GalaRWVU95,
title = {Built-in self test for C-testable ILA s},
author = {Murali M. R. Gala and Don E. Ross and Karan L. Watson and Beena Vasudevan and Peter Utama},
year = {1995},
doi = {10.1109/43.469664},
url = {http://doi.ieeecomputersociety.org/10.1109/43.469664},
tags = {testing, C++},
researchr = {https://researchr.org/publication/GalaRWVU95},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {11},
pages = {1388-1398},
}