Testability of one dimensional ILAs under multiple faults

Murali M. R. Gala, Karan L. Watson, Don E. Ross. Testability of one dimensional ILAs under multiple faults. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 178-181, IEEE, 1993. [doi]

Authors

Murali M. R. Gala

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Karan L. Watson

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Don E. Ross

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