Murali M. R. Gala, Karan L. Watson, Don E. Ross. Testability of one dimensional ILAs under multiple faults. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 178-181, IEEE, 1993. [doi]
@inproceedings{GalaWR93,
title = {Testability of one dimensional ILAs under multiple faults},
author = {Murali M. R. Gala and Karan L. Watson and Don E. Ross},
year = {1993},
doi = {10.1109/VTEST.1993.313327},
url = {http://dx.doi.org/10.1109/VTEST.1993.313327},
researchr = {https://researchr.org/publication/GalaWR93},
cites = {0},
citedby = {0},
pages = {178-181},
booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-8186-3830-3},
}