Francisco J. Galarza-Medina, Jose Luis Garcia-Gervacio, Víctor H. Champac, Alex Orailoglu. Small-delay defects detection under process variation using Inter-Path Correlation. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 127-132, IEEE, 2012. [doi]
Abstract is missing.