Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus. Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. In Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August - 1 September 2006, Dubrovnik, Croatia. pages 433-438, IEEE Computer Society, 2006. [doi]
Abstract is missing.