Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus. Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 181-182, IEEE Computer Society, 2006. [doi]
@inproceedings{GalkeKSWHV06,
title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs},
author = {Christian Galke and René Kothe and S. Schultke and K. Winkler and J. Honko and Heinrich Theodor Vierhaus},
year = {2006},
doi = {10.1109/IOLTS.2006.28},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.28},
tags = {testing, diagnostics},
researchr = {https://researchr.org/publication/GalkeKSWHV06},
cites = {0},
citedby = {0},
pages = {181-182},
booktitle = {12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy},
publisher = {IEEE Computer Society},
isbn = {0-7695-2620-9},
}