Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus. Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 181-182, IEEE Computer Society, 2006. [doi]
Abstract is missing.