Mona Ganji, Marampally Saikiran, Degang Chen. All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{GanjiSC22,
title = {All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis},
author = {Mona Ganji and Marampally Saikiran and Degang Chen},
year = {2022},
doi = {10.1109/VTS52500.2021.9794271},
url = {https://doi.org/10.1109/VTS52500.2021.9794271},
researchr = {https://researchr.org/publication/GanjiSC22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}