Mona Ganji, Marampally Saikiran, Degang Chen. All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.