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Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements

Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères. Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectronics Reliability, 47(9-11):1456-1461, 2007. [doi]

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