Zih-Huan Gao, Hau Hsu, Ting-Shuo Hsu, Jing-Jia Liou. Post-Silicon Test Flow for Aging Prediction. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 70-75, IEEE Computer Society, 2017. [doi]
@inproceedings{GaoHHL17,
title = {Post-Silicon Test Flow for Aging Prediction},
author = {Zih-Huan Gao and Hau Hsu and Ting-Shuo Hsu and Jing-Jia Liou},
year = {2017},
doi = {10.1109/ATS.2017.25},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2017.25},
researchr = {https://researchr.org/publication/GaoHHL17},
cites = {0},
citedby = {0},
pages = {70-75},
booktitle = {26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2437-1},
}