Zih-Huan Gao, Hau Hsu, Ting-Shuo Hsu, Jing-Jia Liou. Post-Silicon Test Flow for Aging Prediction. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 70-75, IEEE Computer Society, 2017. [doi]
Abstract is missing.