Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity

Yong Gao, En Li, Gaofeng Guo. Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity. J. Electronic Testing, 34(2):203-207, 2018. [doi]

Abstract

Abstract is missing.