Zhen Gao, Ruize Wang, Haoyu Du, Pedro Reviriego. Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.