Jian Gao, Yiwen Xu, Yu Jiang 0001, Zhe Liu 0001, Wanli Chang 0001, Xun Jiao, Jiaguang Sun 0001. EM-Fuzz: Augmented Firmware Fuzzing via Memory Checking. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):3420-3432, 2020. [doi]
Abstract is missing.