Pseudo Functional Path Delay Test through Embedded Memories - researchr publication authors

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Yukun Gao, Tengteng Zhang, Punj Pokharel, Swati Chakraborty, D. M. H. Walker. Pseudo Functional Path Delay Test through Embedded Memories. J. Electronic Testing, 31(1):35-42, 2015. [doi]

This author has not been identified. Look up 'Yukun Gao' in GoogleThis author has not been identified. Look up 'Tengteng Zhang' in GoogleThis author has not been identified. Look up 'Punj Pokharel' in GoogleThis author has not been identified. Look up 'Swati Chakraborty' in GoogleThis author has not been identified. Look up 'D. M. H. Walker' in Google

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