Yukun Gao, Tengteng Zhang, Punj Pokharel, Swati Chakraborty, D. M. H. Walker. Pseudo Functional Path Delay Test through Embedded Memories. J. Electronic Testing, 31(1):35-42, 2015. [doi]
@article{GaoZPCW15,
title = {Pseudo Functional Path Delay Test through Embedded Memories},
author = {Yukun Gao and Tengteng Zhang and Punj Pokharel and Swati Chakraborty and D. M. H. Walker},
year = {2015},
doi = {10.1007/s10836-014-5497-x},
url = {http://dx.doi.org/10.1007/s10836-014-5497-x},
researchr = {https://researchr.org/publication/GaoZPCW15},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {31},
number = {1},
pages = {35-42},
}