Technological Variability by Means of a Framework Metamodel

José García-Alonso, Javier Berrocal Olmeda, Juan Manuel Murillo. Technological Variability by Means of a Framework Metamodel. In IIAI 3rd International Congress on Advanced Applied Informatics, IIAI-AAI 2014, Kokura Kita-ku, Japan, August 31 - Sept. 4, 2014. pages 656-661, IEEE, 2014. [doi]

Abstract

Abstract is missing.