Eduardo Garcia-Espinosa, Omar Longoria-Gandara, Enrique Gonzalez-Garcia, Arturo Veloz-Guerrero. Post-silicon validation based on synthetic test patterns for early detection of timing anomalies. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.