Detectability analysis of small delays due to resistive opens considering process variations - researchr publication authors

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Jose Luis Garcia-Gervacio, VÃctor H. Champac. Detectability analysis of small delays due to resistive opens considering process variations. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 195-197, IEEE, 2009. [doi]

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