Jose Luis Garcia-Gervacio, VÃctor H. Champac. Detectability analysis of small delays due to resistive opens considering process variations. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 195-197, IEEE, 2009. [doi]
@inproceedings{Garcia-GervacioC09,
title = {Detectability analysis of small delays due to resistive opens considering process variations},
author = {Jose Luis Garcia-Gervacio and VÃctor H. Champac},
year = {2009},
doi = {10.1109/IOLTS.2009.5196011},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196011},
tags = {points-to analysis, analysis, source-to-source, open-source},
researchr = {https://researchr.org/publication/Garcia-GervacioC09},
cites = {0},
citedby = {0},
pages = {195-197},
booktitle = {15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal},
publisher = {IEEE},
isbn = {978-1-4244-4596-7},
}