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Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies

Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac. Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]

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Jose Luis Garcia-Gervacio

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Jaime Martínez-Castillo

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Víctor H. Champac

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