Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac. Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{Garcia-GervacioMC14,
title = {Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies},
author = {Jose Luis Garcia-Gervacio and Jaime Martínez-Castillo and Víctor H. Champac},
year = {2014},
doi = {10.1109/LATW.2014.6841909},
url = {http://dx.doi.org/10.1109/LATW.2014.6841909},
researchr = {https://researchr.org/publication/Garcia-GervacioMC14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014},
publisher = {IEEE},
}