Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac. Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.