In-depth analysis of digital circuits against soft errors for selective hardening - researchr publication authors

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Mario GarcÃa-Valderas, Marta Portela-GarcÃa, Celia LÃ³pez-Ongil, Luis Entrena. In-depth analysis of digital circuits against soft errors for selective hardening. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 144-149, IEEE, 2009. [doi]

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