Mario GarcÃa-Valderas, Marta Portela-GarcÃa, Celia López-Ongil, Luis Entrena. In-depth analysis of digital circuits against soft errors for selective hardening. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 144-149, IEEE, 2009. [doi]
@inproceedings{Garcia-ValderasPLE09,
title = {In-depth analysis of digital circuits against soft errors for selective hardening},
author = {Mario GarcÃa-Valderas and Marta Portela-GarcÃa and Celia López-Ongil and Luis Entrena},
year = {2009},
doi = {10.1109/IOLTS.2009.5195997},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5195997},
tags = {analysis},
researchr = {https://researchr.org/publication/Garcia-ValderasPLE09},
cites = {0},
citedby = {0},
pages = {144-149},
booktitle = {15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal},
publisher = {IEEE},
isbn = {978-1-4244-4596-7},
}