Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller

Vilson Garcia, Alberto Maciel de Oliveira Teles, Diego Santos Greff, Aline Durrer Patelli Juliani. Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller. In 9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023. pages 2354-2359, IEEE, 2023. [doi]

Authors

Vilson Garcia

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Alberto Maciel de Oliveira Teles

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Diego Santos Greff

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Aline Durrer Patelli Juliani

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