Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller

Vilson Garcia, Alberto Maciel de Oliveira Teles, Diego Santos Greff, Aline Durrer Patelli Juliani. Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller. In 9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023. pages 2354-2359, IEEE, 2023. [doi]

Abstract

Abstract is missing.