Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller

Vilson Garcia, Alberto Maciel de Oliveira Teles, Diego Santos Greff, Aline Durrer Patelli Juliani. Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller. In 9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023. pages 2354-2359, IEEE, 2023. [doi]

@inproceedings{GarciaTGJ23,
  title = {Non-Invasive Fault Detection Through External Magnetic Field Aided by Sigma-Delta Microcontroller},
  author = {Vilson Garcia and Alberto Maciel de Oliveira Teles and Diego Santos Greff and Aline Durrer Patelli Juliani},
  year = {2023},
  doi = {10.1109/CoDIT58514.2023.10284193},
  url = {https://doi.org/10.1109/CoDIT58514.2023.10284193},
  researchr = {https://researchr.org/publication/GarciaTGJ23},
  cites = {0},
  citedby = {0},
  pages = {2354-2359},
  booktitle = {9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-1140-2},
}