Esteban Garita-RodrÃguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar. Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 456-464, IEEE, 2022. [doi]
@inproceedings{Garita-Rodriguez22,
title = {Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products},
author = {Esteban Garita-RodrÃguez and Renato Rimolo-Donadio and Rafael Zamora-Salazar},
year = {2022},
doi = {10.1109/ITC50671.2022.00053},
url = {https://doi.org/10.1109/ITC50671.2022.00053},
researchr = {https://researchr.org/publication/Garita-Rodriguez22},
cites = {0},
citedby = {0},
pages = {456-464},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}